Hastings' Research Group:
Integrated Nanoscale Engineering

Prof. Jeffrey Todd Hastings
Dept. of Electrical and Computer Enginnering
Center for Nanoscale Science and Engineering
Image Information :

The image at left depicts a dual-mode surface plasmon resonance sensor using angular interrogation. Simultaneously exciting two surface plasmon waves (the long- and the short- range surface plasmons) allows one to distinguish surface interactions from bulk refractive index changes.

Image Information :

The image at left illustrates spatial-phase-locked electron beam lithography using mutiple electron-beams (two shown). As the electron beams scan across the sample the fiducial grid produces a secondary electron or photon signal that is processed to provide feedback control. This technique provies nanometer-level pattern placement accuracy with respect to the grid.

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