JEOL 2010F Features

Field Emission Gun operating at 200 keV
Resolution: 0.19 nm point-to-point imaging
Specimen Stage: +- 12 degree tilt
JEOL single, double low background, and GATAN cryo double tilt holders available
Fischione HAADF detector for Z-contrast STEM
Oxford INCA EDX detector
EmiSpec EsVision
GATAN GIF 2000 EELS spectrometer

 

Ideal for: EDS for elemental profiling and mapping, EELS for light element analysis and mapping, SAD for crystal phase structural analysis, high-angle annular dark field (HAADF) STEM for Z-contrast; useful for composite and catalyst research