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The EM Center has acquired a new electron microscope, the Zeiss EVO MA 10. In addition to classic secondary electron imaging capability, this SEM is equipped with an EDS detector for elemental analysis, a backscattered electrons (BSE) detector for compositional contrast, and a variable pressure (VP) detector for environmental microscopy.
The EM Center has acquired a new Hitachi S-4300 FESEM with EBSD, OIM, and EDS mapping and profiling. The EM Center has new computer simulation and modeling capabilities. These include HREM and STEM image simulation, SAED and CBD diffraction simulation, the PDF database, and Accelrys Material Studio with the CASTEP and DMOL3 modules that can […]